What’s New @ CNMS


Wyko NT9800 series optical profilometer

 

The Nanofabrication Research Laboratory has a new Wyko optical profilometer acquired with ARRA funding. The Wyko NT9800 series provides rapid, non-contact 3D measurements of roughness and surface profiles with sub-nanometer out-of-plane resolution. This tool employs coherence scanning interferometry combined with stroboscopic illumination and advanced image analysis to characterize complex surface motions and surface deformations at frequencies up to 2.4 MHz, and is compatible with piezoelectric, electrostatic and other modes of sample actuation in controlled gas-phase environment as well as in vacuum. Applications of the Wyko optical profilometer include characterization of advanced materials for photovoltaics and energy storage and metrology of large area, ultra-smooth surfaces required for neutron reflectivity measurements. Surface mapping of areas as large as 6” wafer is possible in the image stitching mode. Contact Nick Lavrik (lavriknv@ornl.gov) for more information.

 

 

Zeiss MERLIN SEM and Bruker X-Ray Spectrometer

Our new MERLIN SEM from Zeiss is a state of the art scanning electron microscope, optimized for the wide range of applications that it will handle at CNMS. It covers energies from 0.5 to 30keV and can achieve a resolution in secondary electron mode of 0.6nm over this range. The system offers not only two types of detector for Secondary Electron imaging, but an advanced "4+1" quadrant backscattered electron detector, a complete STEM (scanning transmission electron microscope) function with both bright and dark field capability, and a gas injector system that prevents sample charging under the electron beam. Each user of this microscope will now have their own password, giving them the ability to store favorite sets of operating conditions and to customize the displays on the instrument as well as providing a complete record of who has used the instrument, when, and for how long. Our new Bruker X-ray spectrometer, equipped with the latest and most advanced Silicon Drift Detector, will be functioning within a week or so and will provide both conventional spectral analysis as well as new techniques such as spectrum imaging. For more information on either tool, please contact David Joy (joydc@ornl.gov).

ORNL Guest House construction

As you can see, the construction crew is making great progress on the ORNL Guest House! We hope for an early 2011 opening date.