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ELECTRON
MICROSCOPY, NEUTRON AND X-RAY SCATTERING CAPABILITIES
Advanced
Scanning Electron Microscopy and Spectroscopy
- Zeiss Merlin VP SEM/STEM
This SEM features variable-pressure capability to optimize studies of nonconductive samples or samples with low vapor pressures. Equipped for STEM, surface profile back-scatter imaging and EDX spectroscopy.
More info …
Note: This instrument replaced the Hitachi 4700 SEM at CNMS.
Advanced Transmission Electron Microscopy and Spectroscopy
- Zeiss Libra 120 TEM
This TEM features variable voltage (60 to 120 kV) and offers enhanced capabilities for studies of soft nanomaterials while maintaining precision needed for work in catalysts and other “hard” nanomaterials. The instrument is equipped with in-line EELS, providing real-time energy filtered imaging, high angular resolution nano-diffraction, and has cryogenic specimen-loading capabilities. Coupled with user access to higher-voltage and aberration-corrected instruments through the SHaRE user proposal appendix, this new low-voltage TEM offers CNMS users direct access to a very broad range of TEM capabilities.
More info …
Note: This instrument replaced the Hitachi HD2000 STEM at CNMS.
X-ray
Diffraction
- 2-circle
X-ray diffraction
q-2q X-ray
powder diffraction with temperature-controlled sample environment.
77K to 1200K at 1 Bar, 273K to 1200K up to 10 Bar. Reactive
gasses such as H2, CO for varying chemical composition
in sample environment.
- 4-circle
X-ray diffraction
4-circle plus translation stage, high temperature, in-plane thin film diffraction.
Also texture, reflectivity, microdiffraction, reciprocal space mapping.
- Small-angle X-ray scattering, SAXS
Anton Paar SAXSess instrument for small-angle scattering to obtain nanoscale structural information. Also equipped for grazing-incidence measurements on nanomaterial films.
More info …
X-ray
Fluorescence
Bulk,
powder, liquids, thin-film. Standardless and standards-based analysis.
Energy-dispersive detector. Mapping and multipoint capable with 50-micrometer resolution.
Shared
Research Equipment
A cooperative
arrangement with the SHaRE User Facility provides access to a wide variety of advanced
SEM, TEM,
and STEM instruments and expertise located on ORNL's main campus.
Advanced capabilities include atomic-resolution imaging,
high spatial resolution microanalysis (EDS and EELS), and electron holography
using TEM/STEM instruments; a Scanning Auger Microprobe for nanometer-scale
surface microanalysis and depth profiling; a fully automated electron
microprobe for trace element determinations; and a variable
pressure SEM incorporating EDS and XRF analysis for the study of polymeric
and nano-bio samples. These facilities are located outside of the
CNMS but may be requested in a CNMS proposal by attaching the one-page
SHaRE Appendix to provide additional details about your analysis
needs.
Neutron Scattering
CNMS users are encouraged to take advantage of the world-class neutron scattering facilities that are available at ORNL’s High-Flux Isotope Reactor (HFIR) and the Spallation Neutron Source (SNS). Beamlines of particular relevance to CNMS Scientific Themes include the small-angle scattering and reflectometry instruments on the HFIR cold source, HFIR thermal neutron diffraction and spectroscopy capabilities, and instruments at the SNS including the backscattering spectrometer and the liquids and magnetism reflectometers.
CNMS users who would like to incorporate neutron scattering into their user proposals may request neutron beamtime by checking the appropriate box on the CNMS proposal form and attaching the 2-page Neutron Scattering appendix to provide details of their beamtime request. CNMS staff members with experience in neutron scattering will be happy to assist prospective users to identify the appropriate neutron scattering resources, develop competitive beamtime requests, or collaborate on arrangements for potential access as initial users when additional instruments are being commissioned.
Capabilities
provided by other CNMS groups
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